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Unit Under Test

assures a constituent's interoperability in a system.

See Also: UUT, EUT, System Under Test, Device Under Test


Showing results: 211 - 225 of 250 items found.

  • SWB-2813, 4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock

    781420-13 - NI

    4x21, 1 A, 2-Wire Reed Matrix Module for SwitchBlock - The SWB‑2813 is a reed relay matrix module for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.

  • Energy Saving System

    ECO-Vibe neo - EMIC Corporation

    ECO-Vibe neo has been designed for an eco-friendly vibration test system. The test conditions with a vibration test system depends on a unit under test. Generally, the exciting force required for performing a vibration test can be calculated by the product of mass (e.g. test article, jig, table, etc.) and test acceleration. But, when the required exciting force is smaller than the maximum rated exciting force of the vibration test system, the field power supply that the constant current has to be continuously provided to produce the DC magnetic field constitutes a large part of power consumption compared with the drive power for the moving element. ECO-Vibe neo can reduce the power consumption by choosing the exciting force in this case. In addition, you can enjoy a reduction merit of the running cost from the first year when the system is introduced because initial cost is zero.

  • M/MA Module Carrier

    VX405C - Astronics Corporation

    The VX405C carrier provides the mechanical and electrical interfaces between the VXIbus and up to six (6) VITA 12-1996 standard M/MA-Modules. The carrier provides VXI register configuration and access to the M/MA-Module I/O space and memory (if present). Each M/MA-Module is controlled separately and appears as a different logical address in the VXI environment. Over 100 M/MA-Modules are available that can provide custom interfacing to the unit under test (UUT). Up to six (6) unique interfaces may be provided in a single VXI slot.

  • Keysight 20-Channel 5A Form A Switch for 34980A

    34938A - Keysight Technologies

    The Keysight 34938A is a high power general-purpose switch module for the 34980A Multifunction Switch/Measure Unit. It has 20 independent single-pole, single-throw (SPST) 5A relays. This module is used to cycle power to products under test, control indicator and status lights, and to actuate external power relays and solenoids. Its 30VDC/250VAC, 5A contacts can handle up to 150W on a single channel, enough for many power line switching applications. Standard 50-pin Dsub connectors allow for use with standard cables, terminal blocks, or mass interconnect solutions.

  • AOI Handlings System

    MicroContact AG

    The AOI handling system is a compact facility with various test units. Via an ionization cleaning station the ceramics are transferred to the contacting station. There, the resistance values of the substrates are tested with a rigid needle adapter. Afterward, the ceramics are further conveyed to the three (optionally four) AOI test stations (for automatic optical inspection) and are tested for cracks, unevenness, faulty imprints, contamination, etc. The poorly evaluated ceramics arrive at a review station where the operator can assess and evaluate the errors on the monitor. If the operator is uncertain about a fault, the ceramic in question can be positioned under the microscope position and inspected by eye. Poorly defined ceramics are marked accordingly with an ink pen.

  • 4-Quadrant General-Purpose Source/Measure Unit, ±20 V, ±1 A Or ±6 V, ±3 A, 20 W

    N6784A - Keysight Technologies

    The Keysight N6784A is a source/measure unit (SMU) designed for general-purpose precision sourcing and measurement. General-purpose applications can span many different industries and many different devices under test (DUTs). The N6784A SMU is a versatile tool designed to tackle many of these general-purpose applications. Its glitch-free operation ensures safe usage with the DUT during output and measurement range changes, even with capacitances of up to 150 µF. Its 4-quadrant operation enables it to act as a bipolar power supply or a bipolar electronic load, for added versatility. When using the N6784A SMU, engineers can be confident that they have an all-around general-purpose tool for their test systems or lab bench.

  • Test Bench for Starters and Alternators

    MS004 COM - MSG Equipment

    Compact tabletest bench is used for quick and quality diagnostics of starters, alternators and voltage regulators without applying any additional measuring devices. The test bench possess high power, thus, units can be diagnosed under different loads. The equipment has small dimensions, it can be placed both in small service centers and big shops specialized in selling equipment.The bench includes the following diagnostic functions: testing of 12V and 24V alternators under load, 12V and 24V voltage regulators, 12V and 24V starters in idle running mode.Power supply is single-phase 220V, thus, there is no need industrial power supply.The device carries out testing of different alternators under load up to 100A.Connection of the 2nd battery is conducted from outside to the terminals on the bench body to achieve power supply of 24V for more convenient connection. Thus, usage of the 2nd battery is optional.New algorithms of testing have been implemented, meter accuracy has also been improved.

  • Test Bench for Starters and Alternators

    MS002 COM - MSG Equipment

    A high power multifunctional test bench includes the following diagnostic functions: diagnostics of starters, alternators and voltage regulators without applying any additional measuring devices. The test bench was invented on the basis of the requirements of modern service stations: construction implies mounting of majority of units without using additional fixing elements. The bench tests units of 12V and 24V; diagnoses the latest alternators and voltage regulators, which are controlled by car ECU; has ports to connect alternators of different brands and manufacturers: COM (LIN, BSS), P-D, DFM, D+, RLO, C, SIG. Diagnostics is carried out through load simulation of car consumers, change of rotation speed, sending of control signals (external control alternators), tracking of electrical characteristic. Testing results are transmitted to LCD display real-time. Testing modes are switched with membrane keyboard on the control panel of the test bench. The selected mode is lightened with the corresponding indicator.The equipment carries out testing of different alternators under load up to 200A. Power supply is single-phase 380V.

  • IP X3, X4 - Rain Test Chamber

    ACMAS Technologies Pvt. Ltd.

    The rain water or moisture penetrating through a leak in the case, can often reach into the circuit board and lead to failure of the equipment. This problem is frequently encountered with external equipments and devices during storage, usage or transportation in a rainy weather. Therefore, the automotive industries and various research and developmental units often use Rain Test Chambers to test the quality and performance of the product in such extreme environments.Weiber's Rain Test Chambers are such Rain Testing Machines/Chambers used for the testing of automobiles, electronic parts and components, light equipments, voltage cabinets and other wide variety of products under a rainy environment. These IP Test Chamber and IP Testing Chambers are designed to simulate specific environmental conditions, mimicking a natural rainy weather, to test the seals and water proofing capacity of the equipment and devices, thereby providing an estimation of the product performance over a period of time.

  • Multiple Output Bidirectional PSU

    LAB-MOBI - Electronic Test & Power Systems

    The LAB-MOBI is a series of multi channel High Power Bidirectional PSUs. Each system is able to operate as either a DC Source or a DC Electronic Load. This integrated approach features high dynamics enabling the user to switch seamlessly between quadrants. When sinking energy from the unit under test the LAB-MOBI automatically inverts the DC to AC and synchronises this output to the grid. Dedicated application modes are available for battery cycling and emulation, which can be used to implement specific test routines. Other common applications the LAB-MOBI is used for include testing electric motors, fuel cells, super capacitors and solar panels. Max. Volt. Output 1000V,Min. Power 60kW, Max. Power 500kW.

  • Digibridge

    1659 - IET Labs

    The GenRad 1659 Digibridge RLC Tester is an easily programmable, microprocessor-based high performance passive component tester. It automatically identifies the type of component under test and measures in the proper range. The result is simple, precise, unambiguous RLC component testing. The GenRad 1659 RLC Digibridge is an instrument for measuring primary parameters of inductance (L), capacitance (C) and resistance (R) and secondary parameters of dissipation factor (D) and quality factor (Q). GenRad designed this single compact unit with maximum flexibility and operator convenience in mind. The simple front panel design of the Digibridge requires less effort to operate. Digital display and user friendly control allows test parameters and limits to be set easily.

  • 2 GHz Dual 1:4 RF Mux, 75 Ohm Module for 34970A/34972A

    34906A - Keysight Technologies

    The Keysight 34906A RF multiplexer module for the 34970A/34972A Data Acquisition/Switch Unit offers broadband switching capabilities for high-frequency and pulsed signals. Use it to route test signals between your device under test and your signal generator, oscilloscope, spectrum analyzer, or other instrumentation. The RF multiplexers are arranged as two independent 1 x 4 multiplexers, each with a common shield and a switched center conductor. Connections can be made directly to SMB inputs with 2 GHz usable bandwidth, or to the BNC-to-SMB adapters provided with 1 bandwidth. Multiple banks may be cascaded together for applications requiring even larger topologies--create a stubless 16:1 multiplexer in a single frame.

  • Dynamic Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

    GX5295 - Marvin Test Solutions, Inc.

    The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • Digital I/O with Per Channel Programmable Logic Levels and PMU PXI Card

    GX5295 - Terotest Systems Ltd.

    The GX5295 offers outstanding digital test capabilities and channel density in a compact 3U PXI form factor. Offering both performance digital and analog test capabilities, the GX5295 provides a cost-effective, tester per pin architecture - making this card the ideal choice for high throughput, mixed-signal component test applications. Each digital channel can be individually programmed for a drive hi, drive lo, sense hi, sense lo, and load value (with commutation voltage level). In addition, each channel offers a parametric measurement unit (PMU) providing users with the capability to perform parallel DC measurements on the DUT (device under test).

  • In-Circuit Tester Integration

    Corelis, Inc.

    The benefits of boundary-scan are noticed in all phases of a product life cycle. By coupling the power of Corelis boundary-scan tools with an In-Circuit Tester (ICT), a complete, integrated solution is available that offers the best advantages of both technologies.Boundary-scan operates as the perfect companion to ICT. Boundary-scan is capable of testing areas of printed circuit board assemblies that are difficult to access due to physical space constraints and loss of physical access, which is often due to fine pitch components such as Ball Grid Array (BGA) devices. Conversely, the ICT is able to check the non-boundary-scan compatible portion of the unit under test (UUT) such as analog.

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